Xycom XVME-113

Technical Specifications
Memory Capacity
SRAM (battery-backed): 12 MB maximum
EPROM: 24 MB maximum
EEPROM: 12 MB maximum
Flash: 12 MB maximum
Socket Configuration
24 × 32-pin JEDEC sockets arranged in two independent banks
Bank 1: 16 positions
Bank 2: 8 positions
Tag:
VMEbus Interface
Full 32-bit VMEbus slave interface
Supports A16, A24, A32 addressing modes
Programmable address modifier and wait-state generation
Memory Speeds
100 ns, 120 ns, 150 ns, 200 ns device support via jumper selection
Power Requirements
+5 V DC: 1.2 A typical (all sockets populated)
Battery: 3 V lithium, 1 Ah, 5-year life typical
Environmental Ratings
Operating temperature: –40 °C to +85 °C
Storage temperature: –55 °C to +125 °C
Humidity: 5 % to 95 % RH non-condensing
Shock: 30 g operating, 50 g non-operating
Vibration: 2.5 g operating, 5 g non-operating
Functional Features
Dual Independent Memory Banks
Each bank can be configured with different memory types, speeds, and VME address maps, allowing simultaneous code, data, and parameter storage on a single board.
Battery-Backup Circuitry
Maintains SRAM contents and real-time clock operation during power loss.
Write-Protection Logic
Automatic inhibit when supply falls below 4.65 V prevents data corruption during brownouts.
Front-Panel Indicators
LEDs display battery status and active memory bank for rapid field diagnostics.
Configuration Registers
Read-only registers report memory size, type, and speed to the host CPU at boot, eliminating manual detection routines.
Application Scenarios
Defense & Aerospace
Mission computers, radar data buffers, and avionics test equipment demanding extended temperature operation and non-volatile program storage.
Industrial Automation
High-speed PLC program storage, recipe databases, and event logging in factory floor VME controllers.
Transportation
Wayside signaling and on-board train control systems requiring rugged, long-life memory modules.
Research & Test Systems
Data acquisition front-ends and physics experiment controllers that benefit from large, removable EPROM or Flash datasets.




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